Details

Two-dimensional X-ray Diffraction


Two-dimensional X-ray Diffraction


2. Aufl.

von: Bob B. He

151,99 €

Verlag: Wiley
Format: PDF
Veröffentl.: 18.05.2018
ISBN/EAN: 9781119356066
Sprache: englisch
Anzahl Seiten: 496

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Beschreibungen

<p><b>An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals</b></p> <p>Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout.</p> <p>Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. <i>Two-Dimensional X-Ray Diffraction, Second Edition </i>is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author’s coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful.</p> <ul> <li>Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns</li> <li>Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction</li> <li>Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms</li> <li>Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis </li> </ul> <p><i>Two-Dimensional X-Ray Diffraction, Second Edition</i> is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.</p>
<p>Preface xiii</p> <p><b>1. Introduction 1</b></p> <p>1.1 X-Ray Technology, a Brief History, 1</p> <p>1.2 Geometry of Crystals, 2</p> <p>1.3 Principles of X-Ray Diffraction, 11</p> <p>1.4 Reciprocal Space and Diffraction, 13</p> <p>1.5 Two-Dimensional X-Ray Diffraction, 19</p> <p>References, 26</p> <p><b>2. Geometry and Fundamentals 29</b></p> <p>2.1 Introduction, 29</p> <p>2.2 Diffraction Space and Laboratory Coordinates, 31</p> <p>2.3 Detector Space and Detector Geometry, 35</p> <p>2.4 Sample Space and Goniometer Geometry, 46</p> <p>2.5 Transformation from Diffraction Space to Sample Space, 50</p> <p>2.6 Reciprocal Space, 52</p> <p>2.7 Summary, 53</p> <p>References, 55</p> <p><b>3. X-Ray Source and Optics 57</b></p> <p>3.2 X-Ray Optics, 63</p> <p>References, 85</p> <p><b>4. X-Ray Detectors 87</b></p> <p>4.1 History of X-Ray Detection Technology, 87</p> <p>4.2 Point Detectors in Conventional Diffractometers, 89</p> <p>4.3 Characteristics of Point Detectors, 92</p> <p>4.4 Line Detectors, 100</p> <p>4.5 Characteristics of Area Detectors, 107</p> <p>4.6 Types of Area Detectors, 119</p> <p>References, 137</p> <p><b>5. Goniometer and Sample Stages 141</b></p> <p>5.1 Goniometer and Sample Position, 141</p> <p>5.2 Goniometer Accuracy, 145</p> <p>5.3 Sample Alignment and Visualization Systems, 149</p> <p>5.4 Environment Stages, 151</p> <p>References, 155</p> <p><b>6. Data Treatment 157</b></p> <p>6.1 Introduction, 157</p> <p>6.2 Non-Uniform Response Correction, 157</p> <p>6.3 Spatial Correction, 161</p> <p>6.4 Detector Position Accuracy and Calibration, 166</p> <p>6.5 Frame Integration, 177</p> <p>6.6 Multiple Frame Merge, 186</p> <p>6.7 Scanning 2D Pattern, 194</p> <p>6.8 Lorentz, Polarization, and Absorption Corrections, 197</p> <p>References, 208</p> <p><b>7. Phase Identification 211</b></p> <p>7.1 Introduction, 211</p> <p>7.2 Relative Intensity, 212</p> <p>7.3 Geometry and Resolution, 216</p> <p>7.4 Sampling Statistics, 221</p> <p>7.5 Preferred Orientation Effect, 227</p> <p>References, 233</p> <p><b>8. Texture Analysis 235</b></p> <p>8.1 Introduction, 235</p> <p>8.2 Pole Density and Pole-Figure, 236</p> <p>8.3 Fundamental Equations, 238</p> <p>8.4 Data Collection Strategy, 242</p> <p>8.5 Texture Data Process, 251</p> <p>8.6 Orientation Distribution Function, 256</p> <p>8.7 Fiber Texture, 261</p> <p>8.8 Polymer Texture, 264</p> <p>8.9 Other Advantages of XRD2 for Texture, 268</p> <p>References, 269</p> <p><b>9. Stress Measurement 271</b></p> <p>9.1 Introduction, 271</p> <p>9.2 Principle of X-ray Stress Analysis, 280</p> <p>9.3 Theory of Stress Analysis with XRD2, 292</p> <p>9.4 Process of Stress Measurement with XRD2, 307</p> <p>9.5 Experimental Examples, 325</p> <p>A9.1 Calculate Principal Stresses, 349</p> <p>A9.2 Calculate the direction cosines for principal stresses (Eigenvectors), 350</p> <p>References, 353</p> <p><b>10. Small Angle X-ray Scattering 357</b></p> <p>10.1 Introduction, 357</p> <p>10.2 2D SAXS Systems, 361</p> <p>10.3 Applications Examples, 367</p> <p>10.4 Some Innovations in 2D SAXS, 370</p> <p>References, 374</p> <p><b>11. Combinatorial Screening 379</b></p> <p>11.1 Introduction, 379</p> <p>11.2 XRD2 Systems for High Throughput Screening, 380</p> <p>11.3 Combined Screening with XRD2 and Raman, 390</p> <p>Reference, 393</p> <p><b>12. Miscellaneous Applications 395</b></p> <p>12.1 Percent Crystallinity, 395</p> <p>12.2 Crystal Size, 402</p> <p>12.3 Retained Austenite, 412</p> <p>12.4 Crystal Orientation, 414</p> <p>12.5 Thin Film Analysis, 418</p> <p>Reference, 429</p> <p><b>13. Innovation and Future Development 433</b></p> <p>13.1 Introduction, 433</p> <p>13.2 Scanning Line Detector for XRD2, 434</p> <p>13.3 Three-Dimensional Detector, 438</p> <p>13.4 Pixel Direct Diffraction Analysis, 441</p> <p>13.5 High Resolution Two-Dimensional X-Ray Diffractometer, 444</p> <p>References, 451</p> <p>Appendix A. Values of Commonly Used Parameters 453</p> <p>Appendix B. Symbols 459</p> <p>Index 465</p>
<p><b>Bob B. He, PhD,</b> is Director of Innovation and Business Development XRD<sup>2</sup> at Bruker AXS-an industry leader in X-ray diffraction instrumentation and solutions (formally Siemens AXS). Dr. He holds 17 U.S. patents and two R&D 100 awards in XRD instrumentation. In recognition of his contribution to the XRD community, he has been recently awarded ICDD Fellow. He earned his doctorate in materials science from Virginia Tech.
<p><b>An Indispensable Resource for Researchers and Students in Materials Science, Chemistry, Physics, and Pharmaceuticals</b> <p>Written by one of the pioneers of 2D X-Ray Diffraction, this updated and expanded edition of the definitive text in the field provides comprehensive coverage of the fundamentals of that analytical method, as well as state-of-the art experimental methods and applications. Geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis, and combinatorial screening are all covered in detail. Numerous experimental examples in materials research, manufacture, and pharmaceuticals are provided throughout. <p>Two-dimensional x-ray diffraction is the ideal, non-destructive analytical method for examining samples of all kinds including metals, polymers, ceramics, semiconductors, thin films, coatings, paints, biomaterials, composites, and more. <i>Two-Dimensional X-Ray Diffraction, Second Edition</i> is an up-to-date resource for understanding how the latest 2D detectors are integrated into diffractometers, how to get the best data using the 2D detector for diffraction, and how to interpret this data. All those desirous of setting up a 2D diffraction in their own laboratories will find the author's coverage of the physical principles, projection geometry, and mathematical derivations extremely helpful. <ul> <li>Features new contents in all chapters with most figures in full color to reveal more details in illustrations and diffraction patterns</li> <li>Covers the recent advances in detector technology and 2D data collection strategies that have led to dramatic increases in the use of two-dimensional detectors for x-ray diffraction</li> <li>Provides in-depth coverage of new innovations in x-ray sources, optics, system configurations, applications and data evaluation algorithms</li> <li>Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis</li> </ul> <p><i>Two-Dimensional X-Ray Diffraction, Second Edition</i> is an important working resource for industrial and academic researchers and developers in materials science, chemistry, physics, pharmaceuticals, and all those who use x-ray diffraction as a characterization method. Users of all levels, instrument technicians and X-ray laboratory managers, as well as instrument developers, will want to have it on hand.

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