Details

Generalized Weibull Distributions


Generalized Weibull Distributions


SpringerBriefs in Statistics

von: Chin-Diew Lai

53,49 €

Verlag: Springer
Format: PDF
Veröffentl.: 17.10.2013
ISBN/EAN: 9783642391064
Sprache: englisch
Anzahl Seiten: 118

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Beschreibungen

The Weibull distribution has been one of the most cited lifetime distributions in reliability engineering. Over the last decade, many generalizations and extensions of the Weibull have been proposed in order to provide more flexibility than the traditional version when it comes to modeling lifetime data in diverse fields. This book offers an update on these developments, presenting the essential properties of each model. Several plots of density and hazard rate functions are also included, and a brief outline of known application(s) for each model is also given. ​
​1. Weibull Distribution.- 2.Generalized Weibull Distributions.- 3.Models Involving Two or More Weibull Distributions.- 4.Discrete Weibull Distributions and Their Generalizations.- References.- Index.
Chin-Diew Lai is a Professor of Statistics at Massey University, New Zealand. Dr Lai has published over 100 research articles and four monographs, including two published by Springer: “Stochastic Ageing and Dependence for Reliability” co-authored by M Xie, and “Continuous Bivariate Distributions,” 2nd edition, co-authored by N Balakrishnan.
The Weibull distribution has been one of the most cited lifetime distributions in reliability engineering. Over the last decade, many generalizations and extensions of the Weibull have been proposed in order to provide more flexibility than the traditional version when it comes to modeling lifetime data in diverse fields. This book offers an update on these developments, presenting the essential properties of each model. Several plots of density and hazard rate functions are also included, and a brief outline of known application(s) for each model is also given. ​<br><br>
One of the most cited lifetime distributions in reliability engineering Recent updates are treated Applications for each model are presented Includes supplementary material: sn.pub/extras

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